10/31/2023 0 Comments Origin thin setup![]() In the new setup, the stress will be measured with an inhouse developed high accuracy stress sensor that will measure the average stress in the multilayer stack. Therefore, a new experimental setup is needed to measure the through thickness relaxed stress profile of a multi-layered stack with a resolution in thickness of 1 nm and resolution of stress in a layer of 10 nm of 10 MPa, also in case of a multilayer stack. There are no models available to accurately describe these changes in residual stress due to this interaction. When a multi-layer stack is deposited, the layers start to interact with each other significantly affecting the residual stress. Due to the complex origin of the residual stress the models in literature depend on many parameters making accurate determination of these parameters challenging. Numerical models have been developed to calculate these residual stress as a function of the thickness for single layers. Residual stresses already start developing during deposition and growth of the thin films and will further change due to short and long term relaxation effects. Knowledge about the residual stress is crucial because it can limit the performance and lifetime. ![]() ![]() ![]() Thin films are used to obtain high performance and reliability in a large number of technologies including optical communications, microelectronics and wear-resistant coatings. ![]()
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